Thermal imaging and Wave Nondestructive Testing solutions for industrial applications

Short summary A Romanian Research Institute has developed a luminescence thermometry method to measure the thermal image of the targeted surface after applying a thermal phosphor using a spray coating. The method was implemented in a harsh environment (ionizing radiation medium) and proved accurate even at 320 keV. It can perform thermal nondestructive testing that can highlight internal defects in different samples by measuring the temperature changes over time upon different thermal waves.

Full description A Romanian Research Institute has developed a thermal imaging method based on the luminescence lifetime thermometry using a coating of custom design phosphor nano/micro-particles. This thermal imaging method is based on the simultaneous measurement of the emission rise and decay of a transition metal or lanthanide activator. A single pulse time-gated detection method is described, allowing a real-time mode of the temperature measurement, the measurement of emission at its highest temporal intensity, and the tunability of the emission detection in terms of time delay and gate width. Starting from this concept, they developed a thermal luminescence imaging system under a harsh environment with an optimized protocol for obtaining background-free thermal images even at X-rays of 320 keV. It can detect the temperature in a wide range of 80-870 K (it can be extended upon further development). The method can obtain images with 15-20 µm spatial resolution with a maximum of 100 fps. The system and the control and acquisition software are developed by the Research Institute and has the possibility to do custom design experiments for thermal nondestructive testing of different thermal waves to highlight various structural defects.

Advantages and innovations Higher spatial resolution for low dimensions probes; The higher frame rate (currently up to 100 fps) for thermal nondestructive testing when the change in temperature occurs at a higher speed; Higher accuracy (up to ~0.1 K).
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